EE342: FINAL EXAM REVIEW

Date/Time/Room: W 05/12/99 from 6:00pm-9:00pm in Weir 110

Items Allowed During Exam:

• one 8.5"x11" sheet of paper with writing on both sides
• writing utensils, erasers, and calculator

Final Exam Topics:

1. DT Signals
• construction via sampling CT signals
• Shannon's sampling theorem/Nyquist frequency
• ideal and practical sampling results (time, frequency, and reconstruction)
• relationships between CT signal, ideally sampled signal, and practically sampled signal
• common signal definitions (step, unit-pulse, and pulses)
• periodicity test, combination signals, time-shifting
2. DT Systems
• difference equation model (discretize differential equation, solve via recursion or z-transform, construct from transfer function)
• transfer function model (construct from difference equation, solve for output given input, use to characterize system)
• convolution sum model (given input solve for output via sum or z-transform)
• system properties (causal, linear, time-invariant)
• PID control basics
3. DTFT
• x[n] <--> X(Omega)
• plot and interpret magnitude and phase spectra plots
4. DFT
• x[n] -> X_k
• plot and interpret magnitude and phase spectra plots
• relate to DTFT and CTFT
• approximating DTFT and CTFT for truncated signals
• basics of FFT algorithm for computation
5. z-transform
• x[n] <--> X(z) <--> X(Omega)
• solve for DT system outputs given difference equation, convolution, or transfer function models
6. IIR Digital Filter Design and Implementation