#### EE342: FINAL EXAM REVIEW

**Date/Time/Room:** W 05/12/99 from 6:00pm-9:00pm
in Weir 110

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**Items Allowed During Exam:**

- one 8.5"x11" sheet of paper with writing on both sides
- writing utensils, erasers, and calculator

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**Final Exam Topics:**

- DT Signals
- construction via sampling CT signals
- Shannon's sampling theorem/Nyquist frequency
- ideal and practical sampling results (time, frequency,
and reconstruction)
- relationships between CT signal, ideally sampled signal, and
practically sampled signal
- common signal definitions (step, unit-pulse, and pulses)
- periodicity test, combination signals, time-shifting

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- DT Systems
- difference equation model (discretize differential equation,
solve via recursion or z-transform, construct from transfer
function)
- transfer function model (construct from difference equation, solve
for output given input, use to characterize system)
- convolution sum model (given input solve for output via sum or
z-transform)
- system properties (causal, linear, time-invariant)
- PID control basics

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- DTFT
- x[n] <--> X(Omega)
- plot and interpret magnitude and phase spectra plots

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- DFT
- x[n] -> X_k
- plot and interpret magnitude and phase spectra plots
- relate to DTFT and CTFT
- approximating DTFT and CTFT for truncated signals
- basics of FFT algorithm for computation

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- z-transform
- x[n] <--> X(z) <--> X(Omega)
- solve for DT system outputs given difference equation, convolution,
or transfer function models

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- IIR Digital Filter Design and Implementation